MAUD: Combined Analysis Introduction & Practice

D. CHATEIGNER, L. LUTTEROTTI, M. MORALES, O. PÉREZ
CRISMAT-ENSICAEN, IUT-Caen UCBN, Univ. Trento, CIMAP-ENSICAEN

The 11-years old methodology called Combined Analysis using rays (x-rays, neutrons,
electrons) has proved its efficiency in particular in treating QTA from diffraction spectra
using x-rays, neutrons and electrons. Its success concerning QTA summarises as three main
points:

  • it avoids tricky data reductions and corrections, that depend on more or less
    uncontrolled parameters, these latter becoming fitted parameters that are then better
    estimated
  • it solves the difficult overlapping peaks problem (intra- and interphases), with the use
    of an extended Rietveld approach
  • it includes the determination of other important quantities, like residual stresses,
    crystal sizes and microstrains, structures …

Not only Combined Analysis avoids false minima in the refinements when e.g. texture or
structure is the only targeted aspect, but it also allows to benefit from anisotropies in real
samples rather than to suffer for them during characterizations.
We will introduce how Combined Analysis works, then practice it on few examples using the
MAUD software.

Participants would better come with their own laptop, to keep their work when back home.
MAUD, few slides and pre-treated examples with few tutorials can be downloaded at:
http://www.ecole.ensicaen.fr/~chateign/formation/

To participate MAUD, you must be registred